Precession electron diffraction using a digital sampling method

Ultramicroscopy

Volumn 111, Issue 1, 2010, Pages 47-55

  Zhang, Daliang ^a,b   Grüner, Daniel ^a   Oleynikov, Peter ^a   Wan, Wei ^a   Hovmöller, Sven ^a   Zou, Xiaodong ^a  

^a STOCKHOLM UNIVERSITY   (Sweden)

^b JILIN UNIVERSITY   (China)

Author keywords

Crystal structure; Crystallography; Data processing; Lorentz correction; Precession electron diffraction; TEM control

Indexed keywords

DATA COLLECTION; DATA QUALITY; DIGITAL SAMPLING; EQUAL INTERVALS; GEOMETRIC CORRECTION; INTEGRATED INTENSITIES; LORENTZ; OPTICAL AXIS; POST PROCESSING; PRECESSION ELECTRON DIFFRACTION; R VALUE; SOFTWARE-BASED METHOD; SPECIALIZED HARDWARE; STRUCTURE SOLUTIONS; TEM; TRANSMISSION ELECTRON MICROSCOPE;

COMPUTER CONTROL SYSTEMS; CRYSTALLOGRAPHY; DATA PROCESSING; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRONS; MINERALOGY; QUALITY CONTROL; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTAL STRUCTURE;

ARTICLE; COMPUTER PROGRAM; COMPUTER SIMULATION; CONTROLLED STUDY; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; GEOMETRY; PRECESSION ELECTRON DIFFRACTION; QUALITY CONTROL; SAMPLING; SIGNAL PROCESSING; TRANSMISSION ELECTRON MICROSCOPY; VALIDATION PROCESS;

EID: 78649442820     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.09.008     Document Type: Article

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