Imaging conduction pathways in carbon nanotube network transistors by voltage-contrast scanning electron microscopy

Nanotechnology

Volumn 22, Issue 26, 2011, Pages

  Vijayaraghavan, Aravind ^a,b   Timmermans, Marina Y ^c   Grigoras, Kestutis ^c   Nasibulin, Albert G ^c   Kauppinen, Esko I ^c   Krupke, Ralph ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBE NETWORK; ELECTRICAL PERCOLATION; METALLIC NANOTUBES; NANO SCALE; PERCOLATION MODELS; SCANNING ELECTRON MICROSCOPE;

BIAS VOLTAGE; ELECTRONS; FIELD EFFECT TRANSISTORS; SCANNING; SCANNING ELECTRON MICROSCOPY; SINGLE-WALLED CARBON NANOTUBES (SWCN); SOLVENTS;

SINGLE ELECTRON TRANSISTORS;

EID: 79957799368     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/26/265715     Document Type: Article

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