Toward single-chirality carbon nanotube device arrays

ACS Nano

Volumn 4, Issue 5, 2010, Pages 2748-2754

  Vijayaraghavan, Aravind ^a,b   Hennrich, Frank ^a   Stürzl, Ninette ^a   Engel, Michael ^a   Ganzhorn, Marc ^a,c   Oron Carl, Matti ^a   Marquardt, Christoph W ^a   Dehm, Simone ^a   Lebedkin, Sergei ^a   Kappes, Manfred M ^a   Krupke, Ralph ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b Massachusetts Institute of Technology Cambridge   (United States)

^c LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

Chirality; Defects; Directed assembly; Photoluminescence spectroscopy; Polyoctylfluorenyl; Raman spectroscopy; Single wall carbon nanotube

Indexed keywords

CARBON NANOTUBE DEVICES; CONTROL SAMPLES; CRITICAL STEPS; DIELECTROPHORETIC ASSEMBLY; DIRECTED ASSEMBLY; ELECTRON TRANSPORT; EXCITON PEAK; HIGH-DENSITY; LARGE SCALE INTEGRATION; MONODISPERSE; PL SPECTRA; POLYMER WRAPPING; RAMAN SPECTRA; SINGLE-WALL CARBON NANOTUBES; STRUCTURAL DEFECT; SWCNT DEVICES;

CARBON NANOTUBES; CHIRALITY; DEFECTS; ELECTROMECHANICAL DEVICES; ELECTRON TRANSITIONS; ELECTRON TRANSPORT PROPERTIES; ENANTIOMERS; PHOTOLUMINESCENCE; PHOTOLUMINESCENCE SPECTROSCOPY; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; STEREOCHEMISTRY; WALLS (STRUCTURAL PARTITIONS);

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 77952938452     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn100337t     Document Type: Article

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