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Volumn 50, Issue 5 PART 1, 2011, Pages

High temperature-coefficient of resistance at room temperature in W-doped VO2 thin films on Al2O3 substrate and their thickness dependence

(4) Takami, Hidefumi a Kawatani, Kenichi a Kanki, Teruo a Tanaka, Hidekazu a

a OSAKA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING LEVELS; ROOM TEMPERATURE; SENSING PERFORMANCE; SINGLE CRYSTAL SUBSTRATES; TEMPERATURE COEFFICIENT OF RESISTANCE; THICKNESS DEPENDENCE; W-DOPING;

SINGLE CRYSTALS; SUBSTRATES; THIN FILMS;

SEMICONDUCTOR DOPING;

EID: 79957622335 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.50.055804 Document Type: Article

Times cited : (37)

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