Real-time microstructure of shock-compressed single crystals from X-ray diffraction line profiles

Journal of Applied Crystallography

Volumn 44, Issue 3, 2011, Pages 574-584

  Turneaure, Stefan J ^a   Gupta, Y M ^a  

^a WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

microstrain; microstructure; shock compression; X ray diffraction

Indexed keywords

ANALYSIS METHOD; DIFFRACTION SIMULATION; DISTRIBUTION MEASUREMENT; DISTRIBUTION MODELS; ELASTIC STRAIN; ELASTIC-PLASTIC DEFORMATION; GAUSSIAN LINE; GAUSSIANS; GENERAL METHOD; HETEROGENEOUS DISTRIBUTIONS; HETEROGENEOUS STRAIN; HIGH RESOLUTION; INSTRUMENTAL BROADENING; LINE BROADENING; LINE PROFILES; MICRO-STRAIN; MICRO-STRUCTURAL; MICROSTRAINS; MICROSTRUCTURAL INFORMATION; MICROSTRUCTURAL MODELS; MICROSTRUCTURAL PARAMETERS; MULTIPLE DIFFRACTION; QUANTITATIVE RESULT; REAL-TIME X-RAY DIFFRACTION; SHOCK COMPRESSION; SHOCK COMPRESSIONS; WILLIAMSON-HALL; XRD; XRD MEASUREMENTS;

COMPUTER SIMULATION; CRYSTAL MICROSTRUCTURE; DIFFRACTION; ELASTICITY; OPTIMIZATION; SEMICONDUCTOR INSULATOR BOUNDARIES; STRAIN; STRUCTURAL DESIGN; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

SINGLE CRYSTALS;

EID: 79956299589     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889811012908     Document Type: Article

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