Application of a powder diffractometer equipped with a strip detector and Johansson monochromator to phase analysis and structure refinement

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 551, Issue 1, 2005, Pages 162-177

  Paszkowicz, Wojciech ^a  

^a INSTITUTE OF PHYSICS   (Poland)

Author keywords

Defocusing; Diffractometer; Johansson monochromator; Linear detector; Phase analysis; Strip detector; Structure refinement; X ray diffraction

Indexed keywords

CRYSTAL STRUCTURE; DATA ACQUISITION; DIFFRACTOMETERS; MONOCHROMATORS; PHOTONS; POLYCRYSTALLINE MATERIALS; POLYCRYSTALS;

DEFOCUSING; JOHANSSON MONOCHROMATORS; LINEAR DETECTORS; PHASE ANALYSIS; POWDER DIFFRACTOMETERS; STRIP DETECTORS; STRUCTURE REFINEMENT;

X RAY POWDER DIFFRACTION;

EID: 24944556086     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.07.068     Document Type: Conference Paper

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