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Volumn 81, Issue 2, 2002, Pages 283-285
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Electrical conductivity studies of chemical vapor deposited sulfur-incorporated nanocomposite carbon thin films
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CARBON NETWORK;
CARBON THIN FILMS;
CHEMICAL VAPOR DEPOSITED;
DOPANT SOURCES;
ELECTRICAL ACTIVITIES;
ELECTRICAL CONDUCTIVITY;
FOUR-ORDER;
HOT-FILAMENT CHEMICAL VAPOR DEPOSITION;
ROOM TEMPERATURE;
STRUCTURAL DEFECT;
SULFUR ATOMS;
SULFUR CONCENTRATIONS;
SULFUR CONTENTS;
CARBON;
CARRIER CONCENTRATION;
CARRIER MOBILITY;
CHEMICAL VAPOR DEPOSITION;
DEPOSITION;
DOPING (ADDITIVES);
ELECTRIC CONDUCTIVITY;
NANOCOMPOSITE FILMS;
NANOCOMPOSITES;
SULFUR;
THIN FILMS;
CARBON FILMS;
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EID: 79956055972
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1491600 Document Type: Article |
Times cited : (19)
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References (21)
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