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Volumn 81, Issue 2, 2002, Pages 283-285

Electrical conductivity studies of chemical vapor deposited sulfur-incorporated nanocomposite carbon thin films

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NETWORK; CARBON THIN FILMS; CHEMICAL VAPOR DEPOSITED; DOPANT SOURCES; ELECTRICAL ACTIVITIES; ELECTRICAL CONDUCTIVITY; FOUR-ORDER; HOT-FILAMENT CHEMICAL VAPOR DEPOSITION; ROOM TEMPERATURE; STRUCTURAL DEFECT; SULFUR ATOMS; SULFUR CONCENTRATIONS; SULFUR CONTENTS;

EID: 79956055972     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1491600     Document Type: Article
Times cited : (19)

References (21)
  • 2
    • 0001631804 scopus 로고    scopus 로고
    • prb PRBMDO 0163-1829
    • J. F. Prins, Phys. Rev. B 61, 7191 (2000). prb PRBMDO 0163-1829
    • (2000) Phys. Rev. B , vol.61 , pp. 7191
    • Prins, J.F.1
  • 8
    • 0037580660 scopus 로고    scopus 로고
    • mbu MRSBEA 0883-7694
    • J. E. Jaskie, MRS Bull. 21, 59 (1996). mbu MRSBEA 0883-7694
    • (1996) MRS Bull. , vol.21 , pp. 59
    • Jaskie, J.E.1
  • 11
    • 0035269376 scopus 로고    scopus 로고
    • and references therein. drm DRMTE3 0925-9635
    • T. Miyazaki and H. Okushi, Diamond Relat. Mater. 10, 449 (2001), and references therein. drm DRMTE3 0925-9635
    • (2001) Diamond Relat. Mater. , vol.10 , pp. 449
    • Miyazaki, T.1    Okushi, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.