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Applied Physics Letters

Volumn 81, Issue 6, 2002, Pages 1143-1145

Improved temporal resolution in junction-mixing ultrafast scanning tunneling microscopy

(2) Yarotski, D A a Taylor, A J a

a LOS ALAMOS NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATED SIGNALS; METAL-ON-METAL; MICROSTRIP GEOMETRY; MICROSTRIP TRANSMISSION LINES; PICOSECONDS; SCANNING TUNNELING MICROSCOPES; SPATIAL RESOLUTION; TEMPORAL RESOLUTION; TIME RESOLUTION; TRANSIENT VOLTAGE; TRANSMISSION LINE IMPEDANCE; ULTRA-FAST; VOLTAGE PULSE;

BANDPASS FILTERS; ELECTRIC LINES; ELECTRIC POTENTIAL; FULL WIDTH AT HALF MAXIMUM; MICROSTRIP LINES; SCANNING TUNNELING MICROSCOPY; TRANSMISSION LINE THEORY;

POWER QUALITY;

EID: 79956044361 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1490402 Document Type: Article

Times cited : (8)

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