Measuring voltage transients with an ultrafast scanning tunneling microscope

Applied Physics Letters

Volumn 70, Issue 19, 1997, Pages 2625-2627

  Keil, Ulrich D ^a   Jensen, Jacob R ^a   Hvam, Jørn M ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001703710     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118938     Document Type: Article

References (12)

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