메뉴 건너뛰기




Volumn 17, Issue 6, 2000, Pages 1077-1083

Ultrafast, dynamical imaging of surfaces by use of a scanning tunneling microscope with a photoexcited, low-temperature-grown GaAs tip

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM COMPOUNDS; PHOTOCONDUCTIVITY; SCANNING TUNNELING MICROSCOPY;

EID: 0034404761     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.17.001077     Document Type: Article
Times cited : (19)

References (18)
  • 2
    • 0000266883 scopus 로고    scopus 로고
    • The capacitive origin of picosecond electrical transients detected by a photoconductively gated scanning tunneling microscope
    • R. H. M. Groeneveld and H. van Kempen, "The capacitive origin of picosecond electrical transients detected by a photoconductively gated scanning tunneling microscope," Appl. Phys. Lett. 69, 2294-2296 (1996).
    • (1996) Appl. Phys. Lett. , vol.69 , pp. 2294-2296
    • Groeneveld, R.H.M.1    Van Kempen, H.2
  • 3
    • 0000352464 scopus 로고    scopus 로고
    • Fiber-coupled ultrafast scanning tunneling microscope
    • U. D. Keil, J. J. Jensen, and J. M. Hvam, "Fiber-coupled ultrafast scanning tunneling microscope," J. Appl. Phys. 81, 2929-2933 (1997).
    • (1997) J. Appl. Phys. , vol.81 , pp. 2929-2933
    • Keil, U.D.1    Jensen, J.J.2    Hvam, J.M.3
  • 8
  • 9
    • 0001012161 scopus 로고
    • Atomic resolution scanning tunneling microscopy with a gallium arsenide tip
    • G. Nunes and N. M. Amer, "Atomic resolution scanning tunneling microscopy with a gallium arsenide tip," Appl. Phys. Lett. 63, 1851-1853 (1993).
    • (1993) Appl. Phys. Lett. , vol.63 , pp. 1851-1853
    • Nunes, G.1    Amer, N.M.2
  • 11
    • 26844434104 scopus 로고    scopus 로고
    • Ultrafast scanning tunneling microscopy using a photoexcited low-temperature-grown GaAs tip
    • Springer-Verlag, Berlin
    • G. P. Donati, G. Rodriguez, and A. J. Taylor, "Ultrafast scanning tunneling microscopy using a photoexcited low-temperature-grown GaAs tip," in Ultrafast Phenomena XI (Springer-Verlag, Berlin, 1998), pp. 159-161.
    • (1998) Ultrafast Phenomena XI , pp. 159-161
    • Donati, G.P.1    Rodriguez, G.2    Taylor, A.J.3
  • 14
    • 0010969442 scopus 로고    scopus 로고
    • Transient measurements with an ultrafast scanning tunneling microscope on semiconductor surfaces
    • U. D. Keil, J. R. Jensen, and J. M. Hvam, "Transient measurements with an ultrafast scanning tunneling microscope on semiconductor surfaces, " Appl. Phys. Lett. 72, 1644-1646 (1998).
    • (1998) Appl. Phys. Lett. , vol.72 , pp. 1644-1646
    • Keil, U.D.1    Jensen, J.R.2    Hvam, J.M.3
  • 16
    • 0041944924 scopus 로고    scopus 로고
    • Advances in picosecond scanning tunneling microscopy via junction mixing
    • G. M. Steeves, A. Y. Elezzabi, and M. R. Freeman, "Advances in picosecond scanning tunneling microscopy via junction mixing," Appl. Phys. Lett. 70, 1909-1911 (1997).
    • (1997) Appl. Phys. Lett. , vol.70 , pp. 1909-1911
    • Steeves, G.M.1    Elezzabi, A.Y.2    Freeman, M.R.3
  • 17
    • 0001338806 scopus 로고    scopus 로고
    • Nanometer-scale imaging with an ultrafast scanning tunneling microscope
    • G. M. Steeves, A. Y. Elezzabi, and M. R. Freeman, "Nanometer-scale imaging with an ultrafast scanning tunneling microscope," Appl. Phys. Lett. 72, 504-506 (1998).
    • (1998) Appl. Phys. Lett. , vol.72 , pp. 504-506
    • Steeves, G.M.1    Elezzabi, A.Y.2    Freeman, M.R.3
  • 18
    • 0038207409 scopus 로고    scopus 로고
    • Spatio-temporal imaging of voltage pulses with an ultrafast scanning tunneling microscope
    • J. J. Jensen, U. D. Keil, and J. M. Hvam, "Spatio-temporal imaging of voltage pulses with an ultrafast scanning tunneling microscope," Appl. Phys. Lett. 70, 2762-2764 (1997).
    • (1997) Appl. Phys. Lett. , vol.70 , pp. 2762-2764
    • Jensen, J.J.1    Keil, U.D.2    Hvam, J.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.