Second-harmonic spectroscopy of two-dimensional Si nanocrystal layers embedded in SiO2 films

Applied Physics Letters

Volumn 81, Issue 16, 2002, Pages 3034-3036

  Jiang, Y ^a   Sun, L ^a   Downer, M C ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE DIAMETER; BLUE SHIFT; CHARGE LEAKAGE; DEVICE STRUCTURES; ELECTRICAL CHARACTERIZATION; ELECTROSTATIC CHARGING; FREQUENCY DOMAINS; NON-CONTACT; OPTICAL SECOND-HARMONIC GENERATION; PHASE SPECTRA; SECOND-HARMONIC SPECTROSCOPY; SHG INTENSITY; SI NANOCRYSTAL; SI SUBSTRATES; SILICON NANOCRYSTALS; SILICON SUBSTRATES; TIME-DEPENDENT;

ELECTROSTATICS; HARMONIC GENERATION; NANOCRYSTALS; SILICON COMPOUNDS; SILICON OXIDES; SUBSTRATES;

SILICON;

EID: 79956036301     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1510963     Document Type: Article

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