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Volumn 80, Issue 15, 2002, Pages 2699-2700
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Passivation of defects at the SrTiO3/Si interface with H and H2
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Author keywords
[No Author keywords available]
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Indexed keywords
INTERFACIAL DEFECT;
MOLECULAR HYDROGEN;
PHOTOGENERATED CARRIERS;
RECOMBINATION CENTERS;
RF PROBE;
SILICON SURFACES;
SRTIO;
STRONTIUM TITANIUM OXIDES;
CARRIER CONCENTRATION;
HYDROGEN;
MOLECULAR PHYSICS;
PASSIVATION;
STRONTIUM;
STRONTIUM ALLOYS;
STRONTIUM TITANATES;
TITANIUM;
TITANIUM OXIDES;
SURFACE DEFECTS;
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EID: 79955998216
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1472475 Document Type: Article |
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Times cited : (3)
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References (10)
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