Monitoring of the formation and removal of bulk, surface, and interfacial carrier traps on silicon(100)

Canadian Journal of Physics

Volumn 74, Issue , 1996, Pages

  Li, Hongjun ^a   Ogryzlo, Elmer A ^a  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042079827     PISSN: 00084204     EISSN: None     Source Type: Journal    
DOI: 10.1139/p96-865     Document Type: Article

References (17)

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