SCOPUS 정보 검색 플랫폼

Volumn 6, Issue 4, 2011, Pages

Single event imaging for electron microscopy using MAPS detectors

Author keywords

Data acquisition concepts; Data processing methods; Solid state detectors

Indexed keywords

EID: 79955791248 PISSN: 17480221 EISSN: 17480221 Source Type: Journal
DOI: 10.1088/1748-0221/6/04/C04001 Document Type: Conference Paper

Times cited : (10)

References (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.