First use of a high sensitivity active pixel sensor array as a detector for electron microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5301, Issue , 2004, Pages 242-249

  Xuong, Nguyen Huu ^a   Milazzo, Anna Clare ^a   Leblanc, Philippe ^a   Duttweiler, Fred ^a   Bouwer, James ^a   Peltier, Steve ^a   Ellisman, Mark ^a   Denes, Peter ^b   Bieser, Fred ^b   Matis, Howard S ^b   Wieman, Howard ^b   Kleinfelder, Stuart ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Active pixel detector; Active pixel sensor; CCD camera; Electron microscopy

Indexed keywords

ACTIVE PIXEL SENSOR (APS); FULL WIDTH AT HALF MAXIMUM (FWHM); SPATIAL DISTORTION;

CAMERAS; CHARGE COUPLED DEVICES; ELECTRON MICROSCOPY; IMAGE PROCESSING; OPTICAL RESOLVING POWER; OPTICAL TRANSFER FUNCTION; TRANSMISSION ELECTRON MICROSCOPY;

IMAGE SENSORS;

EID: 8844275950     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.526021     Document Type: Conference Paper

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