A rad-hard CMOS active pixel sensor for electron microscopy

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 598, Issue 2, 2009, Pages 642-649

  Battaglia, Marco ^a,b   Contarato, Devis ^b   Denes, Peter ^b   Doering, Dionisio ^b   Giubilato, Piero ^b,c,d   Kim, Tae Sung ^b   Mattiazzo, Serena ^c,d   Radmilovic, Velimir ^b   Zalusky, Sarah ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c SEZIONE DI PADOVA   (Italy)

^d UNIVERSITY OF PADOVA   (Italy)

Author keywords

Monolithic active pixel sensor; Transmission electron microscopy

Indexed keywords

ELECTRON BEAMS; ELECTRON MICROSCOPES; ELECTRONS; FORECASTING; IMAGE SENSORS; OPTICAL TRANSFER FUNCTION; SENSORS;

CHARACTERISATION; CMOS ACTIVE PIXELS; ELECTRON DETECTIONS; MONOLITHIC ACTIVE PIXEL SENSOR; PIXEL SENSORS; PIXEL TEST STRUCTURES; POINT SPREAD FUNCTIONS; TRANSMISSION ELECTRONS;

PIXELS;

EID: 57649089538     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2008.09.029     Document Type: Article

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