Enhanced imaging in low dose electron microscopy using electron counting

Ultramicroscopy

Volumn 109, Issue 12, 2009, Pages 1411-1416

  McMullan, G ^a   Clark, A T ^b   Turchetta, R ^b   Faruqi, A R ^a  

^a MRC LABORATORY OF MOLECULAR BIOLOGY   (United Kingdom)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

CMOS; DQE; Electron counting; MTF

Indexed keywords

CMOS; COUNTING MODE; DETECTIVE QUANTUM EFFICIENCY; DQE; ELECTRON COUNTING; ELECTRON IMAGING; HEURISTIC APPROACH; INCIDENT ELECTRONS; LOW DOSE; MODULATION TRANSFER FUNCTION; MONOLITHIC ACTIVE PIXEL SENSORS; MTF; NYQUIST FREQUENCY; SINGLE EVENT;

FREQUENCY MODULATION; OPTICAL TRANSFER FUNCTION; SENSORS;

ELECTRONS;

ARTICLE; COMPUTER PROGRAM; ELECTRON; ELECTRON MICROSCOPE; ELECTRON MICROSCOPY; ENERGY; IMAGE PROCESSING; IMAGING; MATHEMATICAL COMPUTING; SENSOR; SIGNAL NOISE RATIO;

COMPUTER SIMULATION; ELECTRONS; MICROSCOPY, ELECTRON;

EID: 70349970912     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.07.004     Document Type: Article

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