A system and methodologies for absolute quantum efficiency measurements from the vacuum ultraviolet through the near infrared

Review of Scientific Instruments

Volumn 82, Issue 4, 2011, Pages

  Jacquot, Blake C ^a   Monacos, Steve P ^a   Hoenk, Michael E ^a   Greer, Frank ^a   Jones, Todd J ^a   Nikzad, Shouleh ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DELTA-DOPED; NEAR INFRARED; ON CHIPS; QUANTUM EFFICIENCY MEASUREMENTS; SYSTEM DESIGN; UV- AND; VACUUM ULTRAVIOLETS;

SYSTEMS ANALYSIS; VACUUM;

QUANTUM EFFICIENCY;

EID: 79955606576     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3574220     Document Type: Article

References (22)

1. J. E. Proctor and P. Y. Barnes, J. Res. Natl. Inst. Stand. Technol. 101, 619 (1996).
2. E. M. Gullikson, R. Korde, L. R. Canfield, and R. E. Vest, J. Electron Spectrosc. Relat. Phenom. 80, 313 (1996). 10.1016/0368-2048(96)02983-0 (Pubitemid 126328366)
3. J. L. Lauer, J. L. Shohet, and R. W. Hansen, J. Vac. Sci. Technol. A 21, 1253 (2003). 10.1116/1.1565152
4. J. A. Samson and D. L. Ederer, Vacuum Ultraviolet Spectroscopy (Academic, San Diego, 2000).
5. J. Hopkins, S. H. Wheale, and J. P. S. Badyal, J. Phys. Chem. 33, 14062 (1996). 10.1021/jp953786+
6. W. Wagner, W. Saul, and A. Pruss, J. Phys. Chem. Ref. Data 23, 515 (1994). 10.1063/1.555947
7. A. Wexler, J. Res. Natl. Bur. Stand. 81A, 5 (1977).
8. J. Janesick, Scientific Charge-Coupled Devices (SPIE, Bellingham, WA, 2001)
9. J. Janesick, Photon Transfer (SPIE, Bellingham, WA, 2007).
10. R. W. Leach, Publ. Astron. Soc. Pac. 100, 1287 (1988). 10.1086/132318
11. S. Nikzad, M. E. Hoenk, P. J. Grunthaner, and R. W. Terhune, Proc. SPIE 2278, 138 (1994). 10.1117/12.180023
12. L. R. Canfield, R. E. Vest, R. Korde, H. Schmidtke, and R. Desor, Metrologia 35, 329 (1998). 10.1088/0026-1394/35/4/19
13. P. Kuschnerus, H. Rabus, M. Richter, F. Scholze, L. Werner, and G. Ulm, Metrologia 35, 355 (1998). 10.1088/0026-1394/35/4/23
14. P. F. Morrissey, S. R. McCandliss, and P. D. Feldman, Appl. Opt. 32, 4640 (1995). 10.1364/AO.34.004640
15. M. E. Hoenk, P. J. Grunthaner, F. J. Grunthaner, R. W. Terhune, M. Fattahi, and H. F. Tseng, Appl. Phys. Lett. 61, 1084 (1992). 10.1063/1.107675
16. S. Nikzad, M. E. Hoenk, P. J. Grunthaner, R. W. Terhune, F. J. Grunthaner, R. Winzenread, M. M. Fattahi, H. F. Tseng, and M. P. Lesser, Proc. SPIE 2198, 907 (1994). 10.1117/12.176733
17. S. Nikzad, T. J. Jones, T. J. Cunningham, P. W. Deelman, and S. T. Elliott, Proc. SPIE 4139, 250 (2000). 10.1117/12.410541 (Pubitemid 32227362)
18. J. Blacksberg, M. E. Hoenk, S. T. Elliott, S. E. Holland, and S. Nikzad, Appl. Phys. Lett. 87, 254101 (2005). 10.1063/1.2149181 (Pubitemid 41816193)
19. J. Blacksberg, S. Nikzad, M. E. Hoenk, S. E. Holland, and W. F. Kolbe, IEEE Trans. Electron Devices 55 (12), 3402 (2008). 10.1109/TED.2008.2006779
20. M. E. Hoenk, T. J. Jones, M. R. Dickie, F. Greer, T. J. Cunningham, E. Blazejewski, and S. Nikzad, Proc. SPIE 7419, B-34 (2009).
21. J. Blacksberg, M. E. Hoenk, and S. Nikzad, J. Cryst. Growth 285 (4), 473 (2005). 10.1016/j.jcrysgro.2005.09.005 (Pubitemid 41693752)
22. SPECTRA SOFTWARE, Portland, OR.