Stable silicon photodiodes for absolute intensity measurements in the VUV and soft x-ray regions

Journal of Electron Spectroscopy and Related Phenomena

Volumn 80, Issue , 1996, Pages 313-316

  Gullikson, E M ^a   Korde, R ^b   Canfield, L R ^c   Vest, R E ^c  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b International Radiation Detectors   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001630160     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/0368-2048(96)02983-0     Document Type: Article

References (11)

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11. L. R. Canfield, Robert Vest, Thomas N. Woods, and Raj Korde, Proc. of the SPIE 2282, 31 (1994).