NIST high accuracy reference reflectometer-spectrophotometer

Journal of Research of the National Institute of Standards and Technology

Volumn 101, Issue 5, 1996, Pages 619-627

  Proctor, James E ^a   Barnes, P Yvonne ^a,b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NIST Physics Laboratory   (United States)

Author keywords

Bidirectional; Diffuse; Hemispherical; Monochromator; Reflectance; Reflectometer; Scatter; Spectrophotometer; Specular

Indexed keywords

EID: 0000580493     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.101.061     Document Type: Article

References (6)

1. Victor R. Weidner and Jack J. Hsia, NBS Measurement Services: Spectral Reflectance, NIST Special Publication 250-8, (1987).
2. F. E. Nicodemus, J. C. Richmond, J. J. Hsia, I. W. Ginsburg, and T. Limperis, Geometrical Considerations and Nomenclature for Reflectance, NIST Monograph 160 (1977).
3. Joel B. Fowler, High Accuracy Measurement of Aperture Area Relative to a Standard Known Aperture, J. Res. Natl. Inst. Stand. Technol. 100 (3), 277-283 (1995).
4. P. Yvonne Barnes and Jack J. Hsia, 45°/0° Reflectance Factors of Pressed Polytetraflouroethylene (PTFE) Powder, NIST Technical Note 1413 (1995).
5. John C. Stover, Optical Scattering: Measurement and Analysis - 2nd edition, SPIE Press (1995) pp. 19-22.
6. Barry N. Taylor and Chris E. Kuyatt, Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results, NIST Technical Note 1297 (1994).