-
1
-
-
0031167608
-
4 ceramics studied by transmission electron microscopy
-
4 ceramics studied by transmission electron microscopy. J Ceram Soc Jpn 1997, 105(6):453-475.
-
(1997)
J Ceram Soc Jpn
, vol.105
, Issue.6
, pp. 453-475
-
-
Kleebe, H.-J.1
-
2
-
-
0028422249
-
Calcium-concentration dependent of the intergranular film thickness in silicon-nitride
-
Tanaka I., Kleebe H.-J., Cinibulk M.K., Bruley J., Clarke D.R., Rühle M. Calcium-concentration dependent of the intergranular film thickness in silicon-nitride. J Am Ceram Soc 1994, 77(4):911-914.
-
(1994)
J Am Ceram Soc
, vol.77
, Issue.4
, pp. 911-914
-
-
Tanaka, I.1
Kleebe, H.-J.2
Cinibulk, M.K.3
Bruley, J.4
Clarke, D.R.5
Rühle, M.6
-
3
-
-
0030105859
-
Grain boundary films in rare-earth-glass-based silicon nitride
-
Wang C.M., Pan X., Hoffmann M.J., Cannon R.M., Rühle M. Grain boundary films in rare-earth-glass-based silicon nitride. J Am Ceram Soc 1996, 79(3):788-792.
-
(1996)
J Am Ceram Soc
, vol.79
, Issue.3
, pp. 788-792
-
-
Wang, C.M.1
Pan, X.2
Hoffmann, M.J.3
Cannon, R.M.4
Rühle, M.5
-
4
-
-
0021376276
-
Structure of special grain-boundary in SIALON ceramics
-
Schmid H., Rühle M. Structure of special grain-boundary in SIALON ceramics. J Mater Sci 1984, 19(2):615-628.
-
(1984)
J Mater Sci
, vol.19
, Issue.2
, pp. 615-628
-
-
Schmid, H.1
Rühle, M.2
-
5
-
-
0023126048
-
On the equilibrium thickness of intergranular glass phases in ceramic materials
-
Clarke D.R. On the equilibrium thickness of intergranular glass phases in ceramic materials. J Am Ceram Soc 1987, 70(1):15-22.
-
(1987)
J Am Ceram Soc
, vol.70
, Issue.1
, pp. 15-22
-
-
Clarke, D.R.1
-
6
-
-
8644284266
-
Impact of the intergranular film properties on microstructure and mechanical behavior of silicon nitride
-
Satet R.L., Hoffmann M.J. Impact of the intergranular film properties on microstructure and mechanical behavior of silicon nitride. Key Eng Mater 2004, 264-268:775-780.
-
(2004)
Key Eng Mater
, pp. 775-780
-
-
Satet, R.L.1
Hoffmann, M.J.2
-
7
-
-
1942455803
-
Observation of rare-earth segregation in silicon nitride ceramics at subnanometre dimensions
-
Shibata N., Pennycook S.J., Gosnell T.R., Painter G.S., Shelton W.A., Becher P.F. Observation of rare-earth segregation in silicon nitride ceramics at subnanometre dimensions. Nature 2004, 428(6984):730-733.
-
(2004)
Nature
, vol.428
, Issue.6984
, pp. 730-733
-
-
Shibata, N.1
Pennycook, S.J.2
Gosnell, T.R.3
Painter, G.S.4
Shelton, W.A.5
Becher, P.F.6
-
9
-
-
19944380152
-
Arrangement of rare-earth elements at prismatic grain boundaries in silicon nitride
-
Winkelmann G., Dwyer C., Hudson T.S., Nguyen-Manh D., Döblinger M., Satet R.L., et al. Arrangement of rare-earth elements at prismatic grain boundaries in silicon nitride. Philos Magn Lett 2004, 84(12):755-762.
-
(2004)
Philos Magn Lett
, vol.84
, Issue.12
, pp. 755-762
-
-
Winkelmann, G.1
Dwyer, C.2
Hudson, T.S.3
Nguyen-Manh, D.4
Döblinger, M.5
Satet, R.L.6
-
10
-
-
0024733974
-
High-temperature microstructure of a hot-pressed silicon nitride
-
Clarke D.R. High-temperature microstructure of a hot-pressed silicon nitride. J Am Ceram Soc 1989, 72(9):1604-1609.
-
(1989)
J Am Ceram Soc
, vol.72
, Issue.9
, pp. 1604-1609
-
-
Clarke, D.R.1
-
11
-
-
0027702080
-
Amorphous intergranular films in silicon-nitride ceramics quenched from high temperature
-
Cinibulk M.K., Kleebe H.-J., Schneider G.A., Rühle M. Amorphous intergranular films in silicon-nitride ceramics quenched from high temperature. J Am Ceram Soc 1993, 76(11):2801-2808.
-
(1993)
J Am Ceram Soc
, vol.76
, Issue.11
, pp. 2801-2808
-
-
Cinibulk, M.K.1
Kleebe, H.-J.2
Schneider, G.A.3
Rühle, M.4
-
12
-
-
0037014004
-
Collective effects in grain boundary migration
-
Merkle K.L., Thompson L.J., Phillipp F. Collective effects in grain boundary migration. Phys Rev Lett 2002, 88(22):225501-225504.
-
(2002)
Phys Rev Lett
, vol.88
, Issue.22
, pp. 225501-225504
-
-
Merkle, K.L.1
Thompson, L.J.2
Phillipp, F.3
-
13
-
-
0028533260
-
New high-voltage atomic-resolution microscope approaching 1Ångström point resolution installed in Stuttgart
-
Phillipp F., Höschen R., Osaki M., Möbus G., Rühle M. New high-voltage atomic-resolution microscope approaching 1Ångström point resolution installed in Stuttgart. Ultramicroscopy 1994, 56(1-3):1-10.
-
(1994)
Ultramicroscopy
, vol.56
, Issue.1-3
, pp. 1-10
-
-
Phillipp, F.1
Höschen, R.2
Osaki, M.3
Möbus, G.4
Rühle, M.5
-
14
-
-
0031169945
-
Transient growth bands in silicon nitride cooled in rare-earth based glass
-
Wang C.M., Pan X., Gu H., Duscher G., Hoffmann M.J., Cannon R.M., et al. Transient growth bands in silicon nitride cooled in rare-earth based glass. J Am Ceram Soc 1997, 80(6):1397-1404.
-
(1997)
J Am Ceram Soc
, vol.80
, Issue.6
, pp. 1397-1404
-
-
Wang, C.M.1
Pan, X.2
Gu, H.3
Duscher, G.4
Hoffmann, M.J.5
Cannon, R.M.6
-
15
-
-
84986366949
-
Possible electrical double-layer contribution to the equilibrium thickness of intergranular glass-films in polycrystalline ceramics
-
Clarke D.R., Shaw T.M., Philipse A.P., Horn R.G. Possible electrical double-layer contribution to the equilibrium thickness of intergranular glass-films in polycrystalline ceramics. J Am Ceram Soc 1993, 76(5):1201-1204.
-
(1993)
J Am Ceram Soc
, vol.76
, Issue.5
, pp. 1201-1204
-
-
Clarke, D.R.1
Shaw, T.M.2
Philipse, A.P.3
Horn, R.G.4
-
17
-
-
79955467278
-
-
Estimation of total ionic concentrations in the amorphous phase: the composition of the original powder is 88.6wt.% Si3N4+2wt.% MgO+7.2wt.% La2O3+2.2wt.% SiO2. The amorphous phase is 11.4wt.% of the Si3N4 ceramic system. The mole concentration for MgO and La2O3 are nearly 0.011 and 0.0049mol/cm3. The concentrations of Mg2+ and La3+ in the amorphous phase are about 6.62 and 5.85(number/nm3). The to
-
Estimation of total ionic concentrations in the amorphous phase: the composition of the original powder is 88.6wt.% Si3N4+2wt.% MgO+7.2wt.% La2O3+2.2wt.% SiO2. The amorphous phase is 11.4wt.% of the Si3N4 ceramic system. The mole concentration for MgO and La2O3 are nearly 0.011 and 0.0049mol/cm3. The concentrations of Mg2+ and La3+ in the amorphous phase are about 6.62 and 5.85(number/nm3). The total ion concentration within the whole amorphous phase is estimated to be in the range of 1×100-1×101nm-3. Here, only La3+ is assumed to provide positive charges since there is enough experimental evidence that La segregates in the interface. It should also be noted that the above estimation is the ideal case. Considering the loss of additives and the very low percentage of the IGF in the total amorphous phase (IGF only is approximately 1-0.1% of the total amorphous phase), the number density of mobile ions (La3+ concentration) located in IGF is roughly in the order of 10-3-10-2nm-3. In the calculation 5×10-3nm-3 is used. The ion charge Z, though is +3.
-
-
-
-
18
-
-
0019704533
-
Crystallization of small quantities of glass (or a liquid) segregated in grain-boundaries
-
Raj R., Lange F.F. Crystallization of small quantities of glass (or a liquid) segregated in grain-boundaries. Acta Metall 1981, 29(12):1993-2000.
-
(1981)
Acta Metall
, vol.29
, Issue.12
, pp. 1993-2000
-
-
Raj, R.1
Lange, F.F.2
|