Optical constants of Na-doped ZnO thin films by sol-gel method

Optics Communications

Volumn 284, Issue 12, 2011, Pages 2905-2908

  Lv, Jianguo ^a,b   Huang, Kai ^c   Chen, Xuemei ^b   Zhu, Jianbo ^b   Cao, Chunbin ^a,d   Song, Xueping ^a   Sun, Zhaoqi ^a  

^a ANHUI UNIVERSITY   (China)

^b HEFEI NORMAL UNIVERSITY   (China)

^c ANHUI JIANZHU UNIVERSITY   (China)

^d ANHUI AGRICULTURAL UNIVERSITY   (China)

Author keywords

Na doping; Optical constants; Roughness; Transmittance spectrum; ZnO thin films

Indexed keywords

AVERAGE GRAIN SIZE; EXTINCTION COEFFICIENTS; FORCE MICROSCOPY; HEXAGONAL WURTZITE; NA DOPING; NA-DOPED ZNO; ROUGHNESS; SOL-GEL METHODS; SPECTRAL RANGE; STRUCTURAL AND OPTICAL PROPERTIES; TRANSMITTANCE SPECTRA; TRANSMITTANCE SPECTRUM; UV-VIS SPECTROPHOTOMETERS; ZNO THIN FILM;

CRYSTAL ATOMIC STRUCTURE; METALLIC FILMS; OPTICAL CONSTANTS; OPTICAL FILMS; REFRACTIVE INDEX; SODIUM; SOL-GEL PROCESS; SURFACE ROUGHNESS; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE; ZINC SULFIDE;

SEMICONDUCTOR DOPING;

EID: 79955040187     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2011.01.075     Document Type: Article

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