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Applied Physics Letters

Volumn 85, Issue 3, 2004, Pages 419-421

The structural and optical behaviors of K-doped ZnO/Al2O 3(0001) films

(6) Kim, Sung Kyu a Kim, Shin Ae a Lee, Chang Hee a Lee, Hyeon Jun b Jeong, Se Young b Cho, Chae Ryong c

a Korea Atomic Energy Research Institute (South Korea)

b Pusan National University (South Korea)

c Korea Basic Science Institute (KBSI) (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CARRIER CONCENTRATION; DIFFRACTOMETERS; DOPING (ADDITIVES); ELLIPSOMETRY; HALL EFFECT; LATTICE CONSTANTS; MAGNETIC SEMICONDUCTORS; PHOTOLUMINESCENCE; PHOTOMULTIPLIERS; PHOTONS; POTASSIUM; SCANNING ELECTRON MICROSCOPY; SOL-GELS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

OPTICAL BAND GAPS; RAPID THERMAL ANALYSIS (RTA); TRANSMITTANCE SPECTROSCOPY; X-RAY DIFFRACTOMETERS (XRD);

ZINC OXIDE;

EID: 4043078396 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1773612 Document Type: Article

Times cited : (57)

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