Failures-tolerance and remedial strategies of a PWM multicell inverter

IEEE Transactions on Power Electronics

Volumn 17, Issue 6, 2002, Pages 905-912

  Richardeau, Freédeéric ^a   Baudesson, Philippe ^a   Meynard, Thierry A ^a  

^a UNIVERSITÉ DE TOULOUSE   (France)

Author keywords

Fail safe operation; Faults; Multicell converters; Multilevel converters; Redundancy

Indexed keywords

ELECTRIC COMMUTATION; FAILURE ANALYSIS; INSULATED GATE BIPOLAR TRANSISTORS; MODULATORS; OPTIMIZATION; SHORT CIRCUIT CURRENTS;

FAILURE DIAGNOSIS; MULTICELL CONVERTERS; MULTICELL INVERTER; MULTILEVEL CONVERTERS;

ELECTRIC INVERTERS;

EID: 0036875561     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPEL.2002.805588     Document Type: Article

References (6)

1. O. V. Thorsen and M. Dalva, "A survey of the reliability with an analysis of faults on variable frequency drives in industry," in Proc. Eur. Power Electron. Conf.'95, vol. 1, Sevilla, Spain, 1995, pp. 1.033-1.038.
2. H. Foch and T. Meynard, "Multilevel conversion: High voltage chopper and voltage source inverter," in Proc. IEEE Power Electron. Spec. Conf., Tolède, Spain, 1992, pp. 397-403.
3. T. Meynard, M. Fadel, and N. Aouda, "Modeling of multilevel converter," IEEE Trans. Ind. Electron., vol. 44, pp. 356-364, June 1997.
4. R. S. Chokhawala, J. Catt, and L. Kiraly, "A discussion on IGBT short-circuit behavior and fault protection schemes," IEEE Trans. Ind. Applicat., vol. 31, pp. 256-263, Mar./Apr. 1995.
5. S. Duong, C. Schaeffer, F. Sarrus, and C. Mulertt, "Investigation on the IGBT case explosion in short-circuit operation," in Proc. Eur. Power Electron. Conf., 1997, pp. 2.016-2.021.
6. R. S. Chokhawala and S. Sobhani, "Switching voltage transient protection schemes for high-current IGBT modules," IEEE Trans. Ind. Applicat., vol. 33, pp. 1601-1610, Nov./Dec. 1997.