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Volumn 509, Issue 18, 2011, Pages 5683-5687
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Growth and transport properties of oriented bismuth telluride films
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Author keywords
Crystal growth; Nanostructured materials; Thermoelectric materials; Thin films
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Indexed keywords
BISMUTH TELLURIDE;
BISMUTH TELLURIDE THIN FILMS;
ELECTRICAL CONDUCTIVITY;
FORMATION MECHANISM;
IN-PLANE;
LAYERED NANOSTRUCTURE;
LAYERED STRUCTURES;
NANO-STRUCTURED;
OPTIMAL MORPHOLOGY;
RADIO FREQUENCY MAGNETRON SPUTTERING;
SEM;
SUBSTRATE TEMPERATURE;
THERMOELECTRIC MATERIAL;
BISMUTH;
BISMUTH COMPOUNDS;
CARRIER CONCENTRATION;
CARRIER MOBILITY;
CRYSTAL GROWTH;
CRYSTALLIZATION;
ELECTRIC CONDUCTIVITY;
GRAIN BOUNDARIES;
METAL ANALYSIS;
MICROSTRUCTURE;
MORPHOLOGY;
NANOSTRUCTURED MATERIALS;
SCANNING ELECTRON MICROSCOPY;
THERMAL CONDUCTIVITY;
THERMOELECTRIC EQUIPMENT;
THERMOELECTRICITY;
THIN FILMS;
X RAY DIFFRACTION;
NANOSTRUCTURES;
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EID: 79953268012
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2011.02.123 Document Type: Article |
Times cited : (67)
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References (26)
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