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Journal of Physics and Chemistry of Solids

Volumn 71, Issue 8, 2010, Pages 1131-1136

Electrochemical deposition of Bi2Te3-based thin films

(4) Qiu, Liqin a Zhou, Jian a Cheng, Xuan a Ahuja, Rajeev b

a XIAMEN UNIVERSITY (China)

b UPPSALA UNIVERSITY (Sweden)

Author keywords

A. Chalcogenides; B. Crystal growth; C. Electron microscopy; D. Microstructure

Indexed keywords

A. CHALCOGENIDES; AQUEOUS ELECTROLYTE; B. CRYSTAL GROWTH; C. ELECTRON MICROSCOPY; D. MICROSTRUCTURE; DEPOSITION POTENTIAL; ELECTROCHEMICAL DEPOSITION; ELECTROCHEMICAL REDUCTIONS; ELECTRON MICROPROBE ANALYSIS; ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY; GROWTH ORIENTATIONS; SINGLE PHASE;

CHALCOGENIDES; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; CYCLIC VOLTAMMETRY; ELECTRODEPOSITION; ELECTROLYTIC REDUCTION; ELECTRON PROBE MICROANALYSIS; ELECTRONS; GRAIN BOUNDARIES; MORPHOLOGY; NITRIC ACID; SEMICONDUCTING SELENIUM COMPOUNDS; STAINLESS STEEL; STOICHIOMETRY; TELLURIUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

SCANNING ELECTRON MICROSCOPY;

EID: 77955557500 PISSN: 00223697 EISSN: None Source Type: Journal
DOI: 10.1016/j.jpcs.2010.03.020 Document Type: Conference Paper

Times cited : (25)

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