High thermoelectric performance BiSbTe alloy with unique low-dimensional structure

Journal of Applied Physics

Volumn 105, Issue 11, 2009, Pages

  Xie, Wenjie ^a,b   Tang, Xinfeng ^a   Yan, Yonggao ^a   Zhang, Qingjie ^a   Tritt, Terry M ^b  

^a WUHAN UNIVERSITY OF TECHNOLOGY   (China)

^b CLEMSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS STRUCTURES; BISMUTH TELLURIDE; BULK MATERIALS; COHERENT INTERFACE; COMMERCIAL APPLICATIONS; ELECTRICAL CONDUCTIVITY; FIGURE OF MERIT; LATTICE THERMAL CONDUCTIVITY; LOW-DIMENSIONAL STRUCTURES; NANOCRYSTALLINE; P-TYPE; SPARK PLASMA SINTERING PROCESS; STATE OF THE ART; TEMPERATURE RANGE; THERMAL STABILITY; THERMOELECTRIC MATERIAL; THERMOELECTRIC PERFORMANCE; THERMOPOWER;

BISMUTH; BISMUTH ALLOYS; ELECTRIC CONDUCTIVITY; MATERIALS; MATERIALS HANDLING EQUIPMENT; MELT SPINNING; SPARK PLASMA SINTERING; TELLURIUM COMPOUNDS; THERMAL CONDUCTIVITY; THERMOANALYSIS; THERMOELECTRICITY;

NANOCRYSTALLINE ALLOYS;

EID: 67649525984     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3143104     Document Type: Article

References (43)

1. MRS Bull. 0883-7694 33, special issue edited by, T. M. Tritt, (2008).
2. T. M. Tritt, H. Bottner, and L. D. Chen, MRS Bull. 0883-7694 33, 366 (2008).
3. G. J. Snyder and E. S. Toberer, Nature Mater. 1476-1122 7, 105 (2008). 10.1038/nmat2090
4. B. C. Sales, D. Mandrus, and R. K. Williams, Science 0036-8075 272, 1325 (1996). 10.1126/science.272.5266.1325
5. T. M. Tritt, Science 0036-8075 272, 1276 (1996) 10.1126/science.272.5266. 1276; T. M. Tritt, Science 0036-8075 283, 804 (1999). 10.1126/science.283.5403. 804
6. F. J. Disalvo, Science 0036-8075 285, 703 (1999). 10.1126/science.285. 5428.703
7. D. Singh and I. Teraski, Nature Mater. 1476-1122 7, 616 (2008). 10.1038/nmat2243
8. D. G. Cahill, W. K. Ford, K. E. Goodson, G. D. Mahan, A. Majumdar, H. J. Maris, R. Merlin, and S. R. Phillpot, J. Appl. Phys. 0021-8979 93, 793 (2003). 10.1063/1.1524305
9. A. A. Balandin and O. L. Lazarenkova, Appl. Phys. Lett. 0003-6951 82, 415 (2003). 10.1063/1.1539905
10. L. D. Hicks, T. C. Harman, and M. S. Dresselhaus, Appl. Phys. Lett. 0003-6951 63, 3230 (1993). 10.1063/1.110207
11. L. D. Hicks and M. S. Dresselhaus, Phys. Rev. B 0163-1829 47, 12727 (1993). 10.1103/PhysRevB.47.12727
12. Y. M. Lin, X. Z. Sun, and M. S. Dresselhaus, Phys. Rev. B 0163-1829 62, 4610 (2000). 10.1103/PhysRevB.62.4610
13. D. A. Broido and T. L. Reinecke, Phys. Rev. B 0163-1829 64, 045324 (2001). 10.1103/PhysRevB.64.045324
14. M. S. Toprak, C. Stiewe, D. Platzek, S. Williams, L. Bertini, E. Müller, C. Gatti, Y. Zhang, M. Rowe, and M. Muhammed, Adv. Funct. Mater. 1616-301X 14, 1189 (2004). 10.1002/adfm.200400109
15. P. C. Zhai, W. Y. Zhao, Y. Li, L. S. Liu, X. F. Tang, Q. J. Zhang, and M. Niino, Appl. Phys. Lett. 0003-6951 89, 052111 (2006). 10.1063/1.2234842
16. Z. M. He, C. Stiewe, D. Platzek, G. Karpinski, E. Müller, S. H. Li, M. Toprak, and M. Muhammed, J. Appl. Phys. 0021-8979 101, 053713 (2007). 10.1063/1.2538036
17. K. F. Hsu, S. Loo, F. Guo, W. Chen, J. S. Dyck, C. Uher, T. Hogan, E. K. Polychroniadis, and M. G. Kanatzidis, Science 0036-8075 303, 818 (2004). 10.1126/science.1092963
18. J. Androulakis, K. F. Hsu, R. Pcionek, H. Kong, C. Uher, J. J. D'Angelo, A. Downey, T. Hogan, and M. G. Kanatzidis, Adv. Mater. (Weinheim, Ger.) 0935-9648 18, 1170 (2006). 10.1002/adma.200502770
19. P. F. P. Poudeu, J. D'Angelo, A. D. Downey, J. L. Short, T. P. Hogan, and M. G. Kanatzidis, Angew. Chem. Int. Ed. 45, 3835 (2006). 10.1002/anie.200600865 1433-7851
20. R. Venkatasubramanian, E. Siivola, V. Colpitts, and B. O'Quinn, Nature (London) 0028-0836 413, 597 (2001). 10.1038/35098012
21. X. B. Zhao, X. H. Ji, Y. H. Zhang, T. J. Zhu, J. P. Tu, and X. B. Zhang, Appl. Phys. Lett. 0003-6951 86, 062111 (2005). 10.1063/1.1863440
22. X. F. Tang, W. J. Xie, H. Li, W. Y. Zhao, Q. J. Zhang, and M. Niino, Appl. Phys. Lett. 0003-6951 90, 012102 (2007). 10.1063/1.2425007
23. E. J. Menke, Q. Li, and R. M. Penner, Nano Lett. 1530-6984 4, 2009 (2004). 10.1021/nl048627t
24. M. S. Sander, A. L. Prieto, R. Gronsky, T. Sands, and A. M. Stacy, Adv. Mater. (Weinheim, Ger.) 0935-9648 14, 665 (2002). 10.1002/1521-4095(20020503)14: 9<665::AID-ADMA665>3.0.CO;2-B
25. M. Martín-González, A. L. Prieto, R. Gronsky, T. Sands, and A. M. Stacy, Adv. Mater. (Weinheim, Ger.) 0935-9648 15, 1003 (2003). 10.1002/adma.200304781
26. L. Trahey, C. R. Becker, and A. M. Stacy, Nano Lett. 1530-6984 7, 2535 (2007). 10.1021/nl070711w
27. F. H. Xue, G. T. Fei, B. Wu, P. Cui, and L. D. Zhang, J. Am. Chem. Soc. 0002-7863 127, 15348 (2005). 10.1021/ja0547073
28. B. Yoo, F. Xiao, K. N. Bozhilov, J. Herman, M. A. Ryan, and N. V. Myung, Adv. Mater. (Weinheim, Ger.) 0935-9648 19, 296 (2007). 10.1002/adma.200600606
29. W. Wang, X. L. Lu, T. Zhang, G. Q. Zhang, W. J. Jiang, and X. G. Li, J. Am. Chem. Soc. 0002-7863 129, 6702 (2007). 10.1021/ja070976c
30. A. Purkayastha, S. Kim, D. D. Gandhi, P. G. Ganesan, T. Borca-Tasciuc, and G. Ramanath, Adv. Mater. (Weinheim, Ger.) 0935-9648 18, 2958 (2006). 10.1002/adma.200600495
31. W. G. Lu, Y. Ding, Y. X. Chen, Z. L. Wang, and J. Y. Fang, J. Am. Chem. Soc. 0002-7863 127, 10112 (2005). 10.1021/ja052286j
32. A. Purkayastha, F. Lupo, S. Kim, T. Borca-Tasciuc, and G. Ramanath, Adv. Mater. (Weinheim, Ger.) 0935-9648 18, 496 (2006). 10.1002/adma.200501339
33. B. Poudel, Q. Hao, Y. Ma, Y. Lan, A. Minnich, B. Yu, X. Yan, D. Wang, A. Muto, D. Vashaee, X. Chen, J. Liu, M. S. Dresselhaus, G. Chen, and Z. Ren, Science 0036-8075 320, 634 (2008). 10.1126/science.1156446
34. W. J. Xie, X. F. Tang, Y. G. Yan, Q. J. Zhang, and T. M. Tritt, Appl. Phys. Lett. 0003-6951 94, 102111 (2009). 10.1063/1.3097026
35. A. I. Hochbaum, R. Chen, R. D. Delgado, W. Liang, E. C. Garnett, M. Najarian, A. Majumdar, and P. Yang, Nature (London) 0028-0836 451, 163 (2008). 10.1038/nature06381
36. For MS-SPS and ZM-SPS samples, the measurement direction of thermal diffusivity and electrical transport properties is parallel to direction of applied pressure during the SPS process; for ZM sample, that is along the zone melting direction.
37. H. J. Goldsmid, Electronic Refrigeration (Pion Limited, London, 1986), pp. 29-63.
38. B. C. Sales, D. Mandrus, B. C. Chakoumakos, V. Keppens, and J. R. Thompson, Phys. Rev. B 0163-1829 56, 15081 (1997). 10.1103/PhysRevB.56.15081
39. A. L. Greer, Science 0036-8075 267, 1947 (1995). 10.1126/science.267. 5206.1947
40. H. Chen, Y. He, G. J. Shiflet, and S. J. Poon, Nature (London) 0028-0836 367, 541 (1994). 10.1038/367541a0
41. V. I. Tkatch, A. I. Limanovskii, S. N. Denisenko, and S. G. Rassolov, Mater. Sci. Eng., A 0921-5093 323, 91 (2002). 10.1016/S0921-5093(01)01346-6
42. V. I. Tkatch, S. N. Denisenko, and O. N. Beloshov, Acta Mater. 1359-6454 45, 2821 (1997). 10.1016/S1359-6454(96)00377-1
43. Visually, the contact surface and free surface are very different. The contact surface is very shiny and smooth while the free surface exhibits a dull luster, much like the two sides of a roll of aluminum foil.