Mechanically-exfoliated stacks of thin films of Bi2 Te 3 topological insulators with enhanced thermoelectric performance

Applied Physics Letters

Volumn 97, Issue 13, 2010, Pages

  Goyal, V ^a   Teweldebrhan, D ^a   Balandin, A A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL PROPERTY; FILM THINNING; IN-PLANE; INSULATOR SURFACES; LASER FLASH; MECHANICAL EXFOLIATION; ROOM TEMPERATURE; THERMOELECTRIC CHARACTERIZATION; THERMOELECTRIC EFFICIENCY; THERMOELECTRIC FIGURE OF MERIT; THERMOELECTRIC PERFORMANCE;

ELECTRIC PROPERTIES; TELLURIUM COMPOUNDS; THERMOANALYSIS; TOPOLOGY;

THERMAL CONDUCTIVITY;

EID: 77957674850     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3494529     Document Type: Article

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