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Journal of Analytical Atomic Spectrometry

Volumn 26, Issue 4, 2011, Pages 798-803

A purged argon pre-chamber for analytical glow discharge - Time of flight mass spectrometry applications

(6) Lobo, L a Bordel, N a Pereiro, R a Tempez, A b Chapon, P b Sanz Medel, A a

a UNIVERSITY OF OVIEDO (Spain)

b HORIBA LTD (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL RESULTS; ARGON FLOW; IN-DEPTH PROFILE; ION SIGNALS; MASS SPECTRA; MICROLEAKS; OPERATION MODE; PENETRATION RATES; POLYATOMIC INTERFERENCES; POLYATOMICS; PULSED MODE; RADIO FREQUENCIES; REPRODUCIBILITIES; SAMPLE COMPOSITION; SOLID SAMPLES; STANDARD REFERENCE MATERIAL; TEMPORAL DISCRIMINATION; THIN COATING; TIME OF FLIGHT MASS SPECTROMETRY;

GLOW DISCHARGES; POSITION CONTROL;

MASS SPECTROMETRY;

EID: 79953060655 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/c0ja00160k Document Type: Conference Paper

Times cited : (10)

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