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Volumn , Issue , 2010, Pages 59-91

Advanced Characterization Techniques for Nanostructures

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EID: 79953022920     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-0-8155-1583-8.00003-X     Document Type: Chapter
Times cited : (14)

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