A study of defect structures in oxide materials by secondary ion mass spectrometry

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 625-629

  Haneda, Hajime ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Diffusion; SIMS; Solubility; YAG; ZnO

Indexed keywords

CERAMIC MATERIALS; DIFFUSION; DOPING (ADDITIVES); GRAIN BOUNDARIES; POINT DEFECTS; SECONDARY ION MASS SPECTROMETRY; SOLUBILITY; ZINC COMPOUNDS;

TRANSPARENT CERAMICS;

SURFACE CHEMISTRY;

EID: 0037438260     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00779-1     Document Type: Conference Paper

References (16)

1. Kuwabara M.et al. J. Am. Ceram. Soc. 79:1996;997.
2. Matsuoka M. Jpn. J. Appl. Phys. 10:1971;736.
3. Haneda H., Sakaguchi I., Watanabe A., Ishigaki T., Tanaka J. J. Electrocermics. 4S1:1999;41.
4. Haneda H., Yanagitani T., Sekita S., Okamura F., Shirasaki S. Mat. Sci. Monogr. 664D:1991;2401.
5. Hwang J.-H., Mason T.O., Dravid V.P. J. Am. Ceram. Soc. 77:1994;1499.
6. J. Crank, Mathematics of Diffusion, Oxford Academic Press, 1955, p. 30.
7. Mukae K., Tsuda K. J. Ceram. Soc. Jpn. 100:1992;1048.
8. LeClaire A.D. Brit. J. Appl. Phys. 14:1963;351.
9. Sekita M., Haneda H., Shirasaki S., Yanagitani T. J. Appl. Phys. 67:1990;453.
10. Karato S., Wang Z., Fujino K. J. Mater. Sci. 29:1994;6458.
11. Parthasarathy T.A., Mah T.-J., Keller K. J. Am. Ceram. Soc. 75:1992;1756.
12. French J.D., Zhao J., Harmer M.P., Chan H.M., Miller G.A. J. Am. Ceram. Soc. 77:1994;2857.
13. Haneda H., Miyazawa Y., Sakaguchi I., Nozawa H., Yanagitani T. J. Ceram. Soc. Jpn. 109:2001;115. (in Japanese).
14. J. Crank, Mathematics of Diffusion, Oxford Academic Press, 1955, p. 27.
15. Haneda H., Miyazawa Y., Shirasaki S. J. Cryst. Growth. 68:1984;581.
16. Sakaguchi I., Haneda H., Tanaka J., Yanagitani T. J. Am. Ceram. Soc. 79:1996;1627.