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Physica Status Solidi (B) Basic Research

Volumn 248, Issue 4, 2011, Pages 941-949

Characterization of point defects in ZnO thin films by optical deep level transient spectroscopy

(5) Ellguth, Martin a Schmidt, Matthias a Pickenhain, Rainer a Wenckstern, Holger V a Grundmann, Marius a

a UNIVERSITY OF LEIPZIG (Germany)

Author keywords

Deep level transient spectroscopy; Deep levels; ZnO

Indexed keywords

EID: 79953004977 PISSN: 03701972 EISSN: 15213951 Source Type: Journal
DOI: 10.1002/pssb.201046244 Document Type: Article

Times cited : (13)

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