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Volumn 98, Issue 10, 2011, Pages

Water-related abnormal instability of transparent oxide/organic hybrid thin film transistors

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE LAYER; AMBIENT CONDITIONS; BIAS STABILITY; DIELECTRIC LAYER; GATE INSULATOR; GLASS SUBSTRATES; ON-OFF RATIO; PASSIVATION LAYER; PROCESSING TEMPERATURE; SATURATION MOBILITY; SUBTHRESHOLD SLOPE;

EID: 79952647910     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3551536     Document Type: Article
Times cited : (30)

References (17)
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  • 11
    • 43349108498 scopus 로고    scopus 로고
    • Hysteresis-free pentacene field-effect transistors and inverters containing poly(4-vinyl phenol-co-methyl methacrylate) gate dielectrics
    • DOI 10.1063/1.2924772
    • S. -H. Kim, J. Jang, H. Jeon, W. M. Yun, S. Nam, and C. E. Park, Appl. Phys. Lett. 0003-6951 92, 183306 (2008). 10.1063/1.2924772 (Pubitemid 351662045)
    • (2008) Applied Physics Letters , vol.92 , Issue.18 , pp. 183306
    • Kim, S.H.1    Jang, J.2    Jeon, H.3    Yun, W.M.4    Nam, S.5    Park, C.E.6
  • 12
    • 38549145327 scopus 로고    scopus 로고
    • Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors
    • DOI 10.1063/1.2824758
    • A. Suresh and J. F. Muth, Appl. Phys. Lett. 0003-6951 92, 033502 (2008). 10.1063/1.2824758 (Pubitemid 351160654)
    • (2008) Applied Physics Letters , vol.92 , Issue.3 , pp. 033502
    • Suresh, A.1    Muth, J.F.2
  • 14
    • 0024888643 scopus 로고
    • Physics of amorphous-silicon thin-film transistors
    • DOI 10.1109/16.40933
    • M. J. Powell, IEEE Trans. Electron Devices 0018-9383 36, 2753 (1989). 10.1109/16.40933 (Pubitemid 20653408)
    • (1989) IEEE Transactions on Electron Devices , vol.36 , Issue.12 , pp. 2753-2763
    • Powell Martin, J.1
  • 15
    • 0026909116 scopus 로고
    • 0268-1242, 10.1088/0268-1242/7/8/013
    • N. D. Young and A. Gill, Semicond. Sci. Technol. 0268-1242 7, 1103 (1992). 10.1088/0268-1242/7/8/013
    • (1992) Semicond. Sci. Technol. , vol.7 , pp. 1103
    • Young, N.D.1    Gill, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.