Gate bias stress effects due to polymer gate dielectrics in organic thin-film transistors

Journal of Applied Physics

Volumn 103, Issue 4, 2008, Pages

  Ng, Tse Nga ^a   Daniel, Jürgen H ^a   Sambandan, Sanjiv ^a   Arias, Ana Claudia ^a   Chabinyc, Michael L ^a   Street, Robert A ^a  

^a PALO ALTO RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CHARGE INJECTION; ELECTRIC CURRENT MEASUREMENT; THIN FILM TRANSISTORS; THRESHOLD VOLTAGE;

CHARGE CONCENTRATION; ORGANIC THIN FILM TRANSISTORS; POLYMER DIELECTRICS;

GATE DIELECTRICS;

EID: 40149090305     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2884535     Document Type: Article

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