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Volumn 98, Issue 10, 2011, Pages

Biaxial tensile strain effects on photoluminescence of different orientated Ge wafers

Author keywords

[No Author keywords available]

Indexed keywords

BIAXIAL TENSILE STRAIN; DENSITY OF STATE; DIRECT RECOMBINATION; DIRECT TRANSITION; ELECTRON POPULATION; ENERGY DIFFERENCES; GE WAFER; L-VALLEY; QUASI-FERMI LEVEL;

EID: 79952632440     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3562589     Document Type: Article
Times cited : (22)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.