Measuring the thermal conductivity of porous, transparent SiO2 films with time domain thermoreflectance

Journal of Heat Transfer

Volumn 133, Issue 6, 2011, Pages

  Hopkins, Patrick E ^a   Kaehr, Bryan ^a,b   Phinney, Leslie M ^a   Koehler, Timothy P ^a   Grillet, Anne M ^a   Dunphy, Darren ^b   Garcia, Fred ^b   Brinker, C Jeffrey ^a,b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b University of New Mexico   (United States)

Author keywords

differential effective medium theory; porous SiO2; thermal conductivity; time domain thermoreflectance

Indexed keywords

EFFECTIVE MEDIUM THEORIES; GLASS SLIDES; HEAT SOURCES; NANO-MATERIALS; NANOPOROUS STRUCTURES; NANOSTRUCTURED FILMS; NON-CONTACT; OPTICAL MEASUREMENT; POROUS SIO2; STRUCTURAL ASPECTS; SURFACE VARIABILITY; TEMPERATURE CHANGES; THERMAL CONDUCTIVITY MEASUREMENTS; THERMAL PROPERTIES; THERMAL TRANSPORT; TIME DOMAIN THERMOREFLECTANCE;

NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; OPTICAL DATA PROCESSING; SILICON COMPOUNDS; THERMAL INSULATING MATERIALS;

THERMAL CONDUCTIVITY;

EID: 79952605396     PISSN: 00221481     EISSN: 15288943     Source Type: Journal    
DOI: 10.1115/1.4003548     Document Type: Article

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