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Volumn 74, Issue 1 II, 2003, Pages 400-406

Femtosecond pump-probe nondestructive examination of materials (invited)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CHARGE CARRIERS; FILM GROWTH; LIGHT REFLECTION; LIGHT TRANSMISSION; METALLIC FILMS; NONDESTRUCTIVE EXAMINATION; PHONONS; THERMAL CONDUCTIVITY; THIN FILMS;

EID: 0037280530     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1517187     Document Type: Conference Paper
Times cited : (155)

References (45)
  • 27
    • 0004151745 scopus 로고
    • edited by A.C.S.V. Heel (North-Holland, New York)
    • F. Abeles, in Advanced Optical Techniques, edited by A.C.S.V. Heel (North-Holland, New York, 1967).
    • (1967) Advanced Optical Techniques
    • Abeles, F.1
  • 28
    • 0003740395 scopus 로고
    • edited by F. Abeles (North-Holland, New York)
    • F. Abeles, in Optical Properties of Solids, edited by F. Abeles (North-Holland, New York, 1972).
    • (1972) Optical Properties of Solids
    • Abeles, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.