Femtosecond pump-probe nondestructive examination of materials (invited)

Review of Scientific Instruments

Volumn 74, Issue 1 II, 2003, Pages 400-406

  Norris, Pamela M ^a   Caffrey, Andrew P ^a   Stevens, Robert J ^a   Klopf, J Michael ^b   McLeskey Jr , James T ^c   Smith, Andrew N ^d  

^a UNIVERSITY OF VIRGINIA   (United States)

^b University of Virginia   (United States)

^c Virginia Commonwealth University   (United States)

^d UNITED STATES NAVAL ACADEMY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CHARGE CARRIERS; FILM GROWTH; LIGHT REFLECTION; LIGHT TRANSMISSION; METALLIC FILMS; NONDESTRUCTIVE EXAMINATION; PHONONS; THERMAL CONDUCTIVITY; THIN FILMS;

ENERGY TRANSPORT;

ULTRASHORT PULSES;

EID: 0037280530     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1517187     Document Type: Conference Paper

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