SCOPUS 정보 검색 플랫폼

Volumn 77, Issue 10, 2006, Pages

Reexamining the 3-omega technique for thin film thermal characterization

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DATA REDUCTION; HEAT RESISTANCE; INTERFACES (MATERIALS); THERMAL CONDUCTIVITY; THERMAL EFFECTS;

MATHEMATICAL DERIVATIONS; THERMAL BOUNDARY RESISTANCE; THERMAL PROPERTIES;

THIN FILMS;

EID: 33750530867 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.2349601 Document Type: Conference Paper

Times cited : (118)

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- See EPAPS Document No. E-RSINAK-77-240609 for the MATLAB script used to generate the plots. This document can be reached through a direct link in the online article's HTML reference section or via the EPAPS homepage (http://www.aip.org/pubservs/epaps. html).

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