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Applied Physics Letters

Volumn 98, Issue 9, 2011, Pages

Atomic-resolution scanning transmission electron microscopy through 50-nm-thick silicon nitride membranes

(3) Ramachandra, Ranjan a Demers, Hendrix b De Jonge, Niels a

a VANDERBILT UNIVERSITY SCHOOL OF MEDICINE (United States)

b UNIVERSITÉ DE SHERBROOKE (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC RESOLUTION; ELECTRON BEAM ENERGY; GOLD NANOPARTICLES; IMAGING CONTRAST; IN-SITU ELECTRON MICROSCOPY; MONTE CARLO SIMULATION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SILICON NITRIDE MEMBRANE; SPATIAL FREQUENCY; THICK MEMBRANES;

COMPUTER SIMULATION; ELECTRON BEAM LITHOGRAPHY; ELECTRON BEAMS; ELECTRONS; ENVIRONMENTAL CHAMBERS; MONTE CARLO METHODS; SILICON NITRIDE;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 79952422038 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3561758 Document Type: Article

Times cited : (17)

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