In situ uniaxial mechanical testing of small scale materials - A review

Nanoscience and Nanotechnology Letters

Volumn 2, Issue 4, 2010, Pages 282-287

  Kang, Wonmo ^a   Rajagopalan, Jagannathan ^a   Saif, M Taher A ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

Electron microscopy; In situ uniaxial test; Micro nanomaterials; Microelectromechanical devices; Thin film

Indexed keywords

CHARACTERIZATION; ELECTRON MICROSCOPY; MATERIALS TESTING; MECHANICAL PROPERTIES; MECHANISMS; MICROELECTROMECHANICAL DEVICES; THIN FILMS;

MATERIAL RESPONSE; MICRO/NANO-SCALE; MICRO/NANOMATERIALS; SIZE DEPENDENT; SMALL-SCALE MATERIALS; SUBMICROMETER SCALE; UNIAXIAL TESTS; UNIFORM STRESS;

MECHANICAL TESTING;

EID: 79952383627     PISSN: 19414900     EISSN: 19414919     Source Type: Journal    
DOI: 10.1166/nnl.2010.1107     Document Type: Review

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