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Volumn 50, Issue 5, 2011, Pages 1581-1591

Luminescent ruthenium tripod complexes: Properties in solution and on conductive surfaces

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EID: 79952256785     PISSN: 00201669     EISSN: None     Source Type: Journal    
DOI: 10.1021/ic1002868     Document Type: Article
Times cited : (51)

References (68)
  • 3
    • 0345979435 scopus 로고    scopus 로고
    • Ulman, A. Chem. Rev. 1996, 96, 1533-1554
    • (1996) Chem. Rev. , vol.96 , pp. 1533-1554
    • Ulman, A.1
  • 62
    • 79952268045 scopus 로고    scopus 로고
    • note
    • 3 is about 2 orders of magnitude more resistive than bulk EGaIn, is about 1-2 nm thick, and is rough (the actual contact area is 20-40% of the measured contact area). We will report these findings in a separate paper.
  • 67
    • 79952275414 scopus 로고    scopus 로고
    • note
    • Because the sizes of the AFM tip and EGaln droplet are not comparable and are roughly 3 orders of magnitude apart, an uneven surface on the nanoscale does not necessarily mean a macroscopic effect because the area measured under EGaIn is several micrometers while the defect measured with AFM is on the order of a tenth of a nanometer. The measurements are highly reproducible, and the scan can be repeated several times without any degradation or destruction of the layer, indicating a very stable surface.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.