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3 is about 2 orders of magnitude more resistive than bulk EGaIn, is about 1-2 nm thick, and is rough (the actual contact area is 20-40% of the measured contact area). We will report these findings in a separate paper.
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63
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1642414710
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Walker, A. V., Tighe, T. B., Cabarcos, O. M., Reinard, M. D., Haynie, B. C., Uppili, S., Winograd, N., and Allara, D. L. J. Am. Chem. Soc. 2004, 126, 3954-3963
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, pp. 3954-3963
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Walker, A.V.1
Tighe, T.B.2
Cabarcos, O.M.3
Reinard, M.D.4
Haynie, B.C.5
Uppili, S.6
Winograd, N.7
Allara, D.L.8
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Kim, T. W., Wang, G., Lee, H., and Lee, T. Nanotechnology 2007, 18, 315204-8
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Kim, T.W.1
Wang, G.2
Lee, H.3
Lee, T.4
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Tran, E., Rampi, M. A., and Whitesides, G. M. Angew. Chem., Int. Ed. 2004, 43, 3835-3839
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(2004)
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Tran, E.1
Rampi, M.A.2
Whitesides, G.M.3
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67
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79952275414
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note
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Because the sizes of the AFM tip and EGaln droplet are not comparable and are roughly 3 orders of magnitude apart, an uneven surface on the nanoscale does not necessarily mean a macroscopic effect because the area measured under EGaIn is several micrometers while the defect measured with AFM is on the order of a tenth of a nanometer. The measurements are highly reproducible, and the scan can be repeated several times without any degradation or destruction of the layer, indicating a very stable surface.
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