Surface morphology induced localized electric field and piezoresponse enhancement in nanostructured thin films

ACS Nano

Volumn 5, Issue 2, 2011, Pages 1067-1072

  Sriram, Sharath ^a   Bhaskaran, Madhu ^a   Ahluwalia, Rajeev ^b   Nguyen, Thach G ^a   Ng, Nathaniel ^b   Srolovitz, David J ^b   Kalantar Zadeh, Kourosh ^a   Mitchell, Arnan ^a  

^a RMIT UNIVERSITY   (Australia)

^b INSTITUTE OF HIGH PERFORMANCE COMPUTING   (Singapore)

Author keywords

electric field enhancement; enhancement factor; phase field simulations; piezoelectric thin films; piezoresponse; surface roughness

Indexed keywords

ELECTRIC FIELD ENHANCEMENT; ENHANCEMENT FACTOR; PHASE FIELD SIMULATIONS; PIEZOELECTRIC THIN FILMS; PIEZORESPONSE;

ELECTRIC FIELDS; FERROELECTRIC FILMS; FERROELECTRIC THIN FILMS; FINITE ELEMENT METHOD; MORPHOLOGY; PIEZOELECTRICITY; SURFACE PROPERTIES; SURFACE ROUGHNESS;

SURFACE MORPHOLOGY;

NANOMATERIAL;

ARTICLE; CHEMISTRY; ELECTRICITY; FINITE ELEMENT ANALYSIS; SURFACE PROPERTY;

ELECTRICITY; FINITE ELEMENT ANALYSIS; NANOSTRUCTURES; SURFACE PROPERTIES;

EID: 79951860189     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn103561u     Document Type: Article

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