Measurement of high piezoelectric response of strontium-doped lead zirconate titanate thin films using a nanoindenter

Journal of Applied Physics

Volumn 101, Issue 10, 2007, Pages

  Sriram, S ^a   Bhaskaran, M ^a   Holland, A S ^a   Short, K T ^b   Latella, B A ^b  

^a RMIT UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LEAD COMPOUNDS; MAGNETRON SPUTTERING; PIEZOELECTRICITY; SECONDARY ION MASS SPECTROMETRY; STRONTIUM;

LEAD ZIRCONATE TITANATE (PSZT); PIEZOELECTRIC COEFFICIENT;

THIN FILMS;

EID: 34249950139     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2735407     Document Type: Article

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