Nanocolumnar preferentially oriented PSZT thin films deposited on thermally grown silicon dioxide

Nanoscale Research Letters

Volumn 4, Issue 1, 2009, Pages 29-33

  Sriram, S ^a   Bhaskaran, M ^a   Mitchell, A ^a   Mitchell, D R G ^b   Kostovski, G ^a  

^a RMIT UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

Microscopy; Nanocrystal; PSZT thin films; Silicon dioxide; XRD

Indexed keywords

MICROSCOPY; NANOCRYSTAL; PSZT THIN FILMS; SILICON DIOXIDE; XRD;

ALKALINE EARTH METALS; ELECTRODEPOSITION; FERROELECTRIC FILMS; FERROELECTRIC THIN FILMS; NANOCRYSTALLINE ALLOYS; NANOCRYSTALLINE SILICON; NANOCRYSTALS; NONMETALS; SILICA; SOLIDS; STRONTIUM; THIN FILMS; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 58549097691     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1007/s11671-008-9197-2     Document Type: Article

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