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Volumn 63, Issue 2, 2010, Pages 189-191
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Low-temperature deposition of high-response piezoelectric thin films
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Author keywords
Crystalline oxides; Electromechanical properties; High resolution electron microscopy; Thin films
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Indexed keywords
CRYSTALLINE OXIDES;
ELECTROMECHANICAL PROPERTY;
GUIDING EFFECT;
HIGH RESPONSE;
LEAD ZIRCONATE TITANATE;
LOW TEMPERATURES;
LOW-TEMPERATURE DEPOSITION;
MICRO-STRUCTURAL CHARACTERIZATION;
PIEZOELECTRIC COEFFICIENT;
PIEZOELECTRIC RESPONSE;
PIEZOELECTRIC THIN FILMS;
SILICON SUBSTRATES;
CRYSTALLINE MATERIALS;
DEPOSITION;
PIEZOELECTRICITY;
STRONTIUM;
STRONTIUM TITANATES;
THIN FILMS;
VAPOR DEPOSITION;
HIGH RESOLUTION ELECTRON MICROSCOPY;
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EID: 77955925741
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/j.scriptamat.2010.03.041 Document Type: Article |
Times cited : (10)
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References (18)
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