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Journal of Applied Physics

Volumn 109, Issue 3, 2011, Pages

Permittivity scaling in Ba1-xSrxTiO3 thin films and ceramics

(4) Aygün, Seymen M a Ihlefeld, Jon F b Borland, William J c Maria, Jon Paul a

a North Carolina State University (United States)

b SANDIA NATIONAL LABORATORIES (United States)

c DUPONT COMPANY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE THIN FILMS; BULK CERAMICS; BULK-LIKE; COMPLEX OXIDES; DIELECTRIC RESPONSE; DIELECTRIC SCALING; ELECTROMECHANICAL PROPERTY; ELECTROMECHANICAL RESPONSE; GRAIN SIZE; INTERFACIAL LAYER; LITERATURE DATA; MATERIAL SYNTHESIS; ORGANIC REMOVAL; PERMITTIVITY VALUES; PHYSICAL DIMENSIONS; PHYSICAL MODEL; ROOM TEMPERATURE; THIN FILM SYSTEMS; TIO;

BARIUM; CERAMIC MATERIALS; FERROELECTRIC FILMS; FERROELECTRIC THIN FILMS; PERMITTIVITY;

BARIUM TITANATE;

EID: 79951815076 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3514127 Document Type: Article

Times cited : (43)

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