Dielectric and microstructural properties of barium titanate zirconate thin films on copper substrates

Journal of Materials Research

Volumn 20, Issue 10, 2005, Pages 2838-2844

  Ihlefeld, J F ^a   Maria, J P ^a   Borland, W ^b  

^a North Carolina State University   (United States)

^b DUPONT COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE; CHEMICAL VAPOR DEPOSITION; COPPER; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; DIELECTRIC PROPERTIES; GRAIN SIZE AND SHAPE; HYSTERESIS; PERMITTIVITY; TEMPERATURE MEASUREMENT; THERMAL EFFECTS; ZIRCONIUM COMPOUNDS;

BARIUM TITANATE ZIRCONATE (BTZ); CHEMICAL SOLUTION DEPOSITION (CSD) METHOD; GRAIN SIZE EFFECT;

THIN FILMS;

EID: 29144455358     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2005.0342     Document Type: Article

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