A novel approach to characterizing the surface topography of niobium superconducting radio frequency (SRF) accelerator cavities

Applied Surface Science

Volumn 257, Issue 11, 2011, Pages 4781-4786

  Tian, Hui ^a,b   Ribeill, Guilhem ^a,c   Xu, Chen ^b   Reece, Charles E ^a   Kelley, Michael J ^a,b  

^a THOMAS JEFFERSON NATIONAL ACCELERATOR FACILITY   (United States)

^b Dept of Economics and Thomas Jefferson Program in Public Policy at the College of William and Mary   (United States)

^c NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Niobium; Power spectral density; SRF cavities; Surface topography

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL MECHANICAL POLISHING; ELECTROLYTIC POLISHING; FOURIER ANALYSIS; NIOBIUM; POWER SPECTRAL DENSITY; RADIO WAVES; SPECTRAL DENSITY; SUPERCONDUCTING MATERIALS; SURFACE TOPOGRAPHY; TOPOGRAPHY;

BUFFERED CHEMICAL POLISHING; GEOMETRICAL FIELD ENHANCEMENT; PERFORMANCE LIMITATIONS; POWER SPECTRAL DENSITIES (PSD); QUANTITATIVE DESCRIPTION; SRF CAVITIES; SUPERCONDUCTING RADIO FREQUENCY; TOPOGRAPHICAL EVOLUTION;

SURFACE ROUGHNESS;

EID: 79951670567     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.11.159     Document Type: Article

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