Surface studies of niobium chemically polished under conditions for superconducting radio frequency (SRF) cavity production

Applied Surface Science

Volumn 253, Issue 3, 2006, Pages 1236-1242

  Tian, Hui ^a   Reece, Charles E ^a   Kelley, Michael J ^a   Wang, Shancai ^b   Plucinski, Lukasz ^b   Smith, Kevin E ^b   Nowell, Matthew M ^c  

^a THOMAS JEFFERSON NATIONAL ACCELERATOR FACILITY   (United States)

^b USA   (United States)

^c EDAX TSL   (United States)

Author keywords

Accelerator cavities; Chemical etching; Niobium RF cavities; Surface analysis

Indexed keywords

CHEMICAL POLISHING; ETCHING; NANOSTRUCTURED MATERIALS; ROUGHNESS MEASUREMENT; SURFACE PHENOMENA; SURFACE TREATMENT;

ACCELERATOR CAVITIES; CHEMICAL ETCHING; NIOBIUM RF CAVITIES; SUPERCONDUCTING RADIO FREQUENCY (SRF);

NIOBIUM COMPOUNDS;

EID: 33750682643     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.01.083     Document Type: Article

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