Accurate determination of the index of refraction of polymer blend films by spectroscopic ellipsometry

Journal of Physical Chemistry C

Volumn 114, Issue 35, 2010, Pages 15094-15101

  Ng, Annie ^a   Li, Chi Ho ^b   Fung, Man Kin ^a   Djuriŝić, Aleksandra B ^a   Zapien, J A ^c   Chan, Wai Kin ^b   Cheung, Kai Yin ^d   Wong, Wai Yeung ^d  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^c Centre for Advanced Luminescence Materials   (United States)

^d HONG KONG BAPTIST UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

BLEND FILMS; BULK HETEROJUNCTION; CAUCHY MODEL; GRADED LAYERS; INDEX OF REFRACTION; MATERIAL SYSTEMS; METHYL ESTERS; MULTIPLE SOLUTIONS; NONIDEAL; OPTICAL FUNCTION; ORGANIC PHOTOVOLTAICS; POLY (3-HEXYLTHIOPHENE); POLYMER-BLEND FILMS; SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS; SURFACE CHARACTERIZATION; THICKNESS ESTIMATION;

BUTYRIC ACID; ESTERS; HETEROJUNCTIONS; POLYMER BLENDS; POLYMER FILMS; REFRACTION; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; SURFACE PROPERTIES; SURFACE ROUGHNESS; THICKNESS MEASUREMENT;

SPECTROSCOPIC ANALYSIS;

EID: 79951608073     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp104398f     Document Type: Article

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